Imaging secondary-ion mass spectroscopy observation of the scavenging of siliceous film from 8-mol%-yttria-stabilized zirconia by the addition of alumina

Jong Heun Lee; Toshiyuki Mori; Ji Guang Li; Takayasu Ikegami; Manabu Komatsu; Hajime Haneda

doi:10.1111/j.1151-2916.2000.tb01366.x

Imaging secondary-ion mass spectroscopy observation of the scavenging of siliceous film from 8-mol%-yttria-stabilized zirconia by the addition of alumina

Jong Heun Lee, Toshiyuki Mori, Ji Guang Li, Takayasu Ikegami, Manabu Komatsu, Hajime Haneda

Research output: Contribution to journal › Article › peer-review

13 Citations (Scopus)

Abstract

The scavenging of a resistive siliceous phase via the addition of Al₂O₃ was studied, using imaging secondary-ion mass spectroscopy (SIMS), given the improved grain-boundary conductivity in 8-mol%-yttria-stabilized zirconia (8YSZ). The grain-boundary resistivity in 8YSZ decreased noticeably with the addition of 1 mol% of Al₂O₃. Strong SiO₂ segregation at the grain boundaries was observed in a SIMS map of pure 8YSZ that contained 120 ppm of SiO₂ (by weight). The addition of 1 mol% of Al₂O₃ caused the SiO₂ to gather around the Al₂O₃ particles. The present observations provided direct and visual evidence of SiO₂ segregation at the grain boundaries (which had a deleterious effect on grain-boundary conductivity) and the scavenging of SiO₂ via Al₂O₃ addition.

Original language	English
Pages (from-to)	1273-1275
Number of pages	3
Journal	Journal of the American Ceramic Society
Volume	83
Issue number	5
DOIs	https://doi.org/10.1111/j.1151-2916.2000.tb01366.x
Publication status	Published - 2000
Externally published	Yes

ASJC Scopus subject areas

Ceramics and Composites
Materials Chemistry

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10.1111/j.1151-2916.2000.tb01366.x

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title = "Imaging secondary-ion mass spectroscopy observation of the scavenging of siliceous film from 8-mol%-yttria-stabilized zirconia by the addition of alumina",

abstract = "The scavenging of a resistive siliceous phase via the addition of Al2O3 was studied, using imaging secondary-ion mass spectroscopy (SIMS), given the improved grain-boundary conductivity in 8-mol%-yttria-stabilized zirconia (8YSZ). The grain-boundary resistivity in 8YSZ decreased noticeably with the addition of 1 mol% of Al2O3. Strong SiO2 segregation at the grain boundaries was observed in a SIMS map of pure 8YSZ that contained 120 ppm of SiO2 (by weight). The addition of 1 mol% of Al2O3 caused the SiO2 to gather around the Al2O3 particles. The present observations provided direct and visual evidence of SiO2 segregation at the grain boundaries (which had a deleterious effect on grain-boundary conductivity) and the scavenging of SiO2 via Al2O3 addition.",

author = "Lee, {Jong Heun} and Toshiyuki Mori and Li, {Ji Guang} and Takayasu Ikegami and Manabu Komatsu and Hajime Haneda",

year = "2000",

doi = "10.1111/j.1151-2916.2000.tb01366.x",

language = "English",

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journal = "Journal of the American Ceramic Society",

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T1 - Imaging secondary-ion mass spectroscopy observation of the scavenging of siliceous film from 8-mol%-yttria-stabilized zirconia by the addition of alumina

AU - Lee, Jong Heun

AU - Mori, Toshiyuki

AU - Li, Ji Guang

AU - Ikegami, Takayasu

AU - Komatsu, Manabu

AU - Haneda, Hajime

PY - 2000

Y1 - 2000

N2 - The scavenging of a resistive siliceous phase via the addition of Al2O3 was studied, using imaging secondary-ion mass spectroscopy (SIMS), given the improved grain-boundary conductivity in 8-mol%-yttria-stabilized zirconia (8YSZ). The grain-boundary resistivity in 8YSZ decreased noticeably with the addition of 1 mol% of Al2O3. Strong SiO2 segregation at the grain boundaries was observed in a SIMS map of pure 8YSZ that contained 120 ppm of SiO2 (by weight). The addition of 1 mol% of Al2O3 caused the SiO2 to gather around the Al2O3 particles. The present observations provided direct and visual evidence of SiO2 segregation at the grain boundaries (which had a deleterious effect on grain-boundary conductivity) and the scavenging of SiO2 via Al2O3 addition.

AB - The scavenging of a resistive siliceous phase via the addition of Al2O3 was studied, using imaging secondary-ion mass spectroscopy (SIMS), given the improved grain-boundary conductivity in 8-mol%-yttria-stabilized zirconia (8YSZ). The grain-boundary resistivity in 8YSZ decreased noticeably with the addition of 1 mol% of Al2O3. Strong SiO2 segregation at the grain boundaries was observed in a SIMS map of pure 8YSZ that contained 120 ppm of SiO2 (by weight). The addition of 1 mol% of Al2O3 caused the SiO2 to gather around the Al2O3 particles. The present observations provided direct and visual evidence of SiO2 segregation at the grain boundaries (which had a deleterious effect on grain-boundary conductivity) and the scavenging of SiO2 via Al2O3 addition.

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Imaging secondary-ion mass spectroscopy observation of the scavenging of siliceous film from 8-mol%-yttria-stabilized zirconia by the addition of alumina

Abstract

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