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Impact of bottom-gate biasing on implant-free junctionless Ge-on-insulator n-MOSFETs
Hyeong Rak Lim, Seong Kwang Kim, Jae Hoon Han, Hansung Kim, Dae Myeong Geum, Yun Joong Lee, Byeong Kwon Ju, Hyung Jun Kim, Sanghyeon Kim
Research output: Contribution to journal › Article › peer-review
9
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(Scopus)