Frequency-dependent impedance spectroscopy was applied to the 2-dimensioanl conduction transport in the LaAlO3/SrxCa1-xTiO3/SrTiO3 system. The 2-dimensional conduction modifies the electrical/dielectric responses of the LaAlO3/SrxCa1-xTiO3/SrTiO3 depending on the magnitude of the interfacial 2-dimensional resistance. The high conduction of the 2-dimensional electron gas (2DEG) layer can be described using a metallic resistor in series with two parallel RC circuits. However, the high resistance of the 2-dimensional layer drives the composite system from a finite low resistor in parallel with the surrounding dielectrics composed of LaAlO3 and SrTiO3 materials to a dielectric capacitor. This change in the resistance of the 2-dimensional layers modifies the overall impedance enabled by the presence of the interfacial layer due to SrxCa1-xTiO3, which alters the charge transport of the 2-dimensional layer from metallic to semiconducting conduction. A noticeable change is observed in the capacitance Bode plots, indicating highly amplified dielectric constants compared with the pristine SrTiO3 substrates and SrxCa1-xTiO3 with a greater Ca content.
Bibliographical notePublisher Copyright:
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- Electrical/Dielectric Properties
- Impedance Spectroscopy
- Interfacial Property
- Multilayered Oxide System
ASJC Scopus subject areas
- General Chemistry
- General Materials Science
- Condensed Matter Physics