Impedance Spectroscopy of Dielectric Relaxation in a Perfluorosulfonic Acid Ionomer Nafion Membrane

Jun Hee Han, Kyu Won Lee, Cheol Eui Lee, Se Hun Kim

    Research output: Contribution to journalArticlepeer-review

    Abstract

    We have employed impedance spectroscopy in order to study the intrinsic dielectric properties and dynamics of a perfluorosulfonic acid ionomer Nafion (NR-211) membrane. Distinct dielectric relaxation processes involving ionic and chain motions were elucidated by using a frequency-temperature contour plot analysis of the dielectric loss. Furthermore, the low-frequency dielectric loss data that reflect the fractal chain structure of the Nafion system indicated the least topological imperfection of the ionic clusters at the temperature of the maximum loss tangent, Tg = 325 K. An equivalent circuit analysis of the complex impedance manifested a drastic motional slowing down that was apparently associated with a relaxation process around Tg.

    Original languageEnglish
    Pages (from-to)476-479
    Number of pages4
    JournalJournal of the Korean Physical Society
    Volume72
    Issue number3
    DOIs
    Publication statusPublished - 2018 Feb 1

    Bibliographical note

    Publisher Copyright:
    © 2018, The Korean Physical Society.

    Keywords

    • Dielectric relaxation
    • Impedance spectroscopy
    • Nafion membrane

    ASJC Scopus subject areas

    • General Physics and Astronomy

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