Improved phase sensitivity in spectral domain phase microscopy using line-field illumination and self phase-referencing

Keyphrases

• Phase Microscopy 100%
• Phase Reference 100%
• Phase Microscope 100%
• Quantitative Phase 100%
• Spectral Domain 100%
• Line Field 100%
• Phase Sensitivity 100%
• High-resolution 50%
• Cell Surface 50%
• Nanometer Scale 50%
• Spectral Domain Optical Coherence Tomography (SD-OCT) 50%
• Cell Motility 50%
• HeLa Cells 50%
• Path Length 50%
• Phase Noise 50%
• Referencing Method 50%
• High numerical Aperture 50%
• Two-dimensional Surface 50%
• Phase Measurement 50%
• Surface Profiling 50%
• Common Mode 50%
• Line Illumination 50%
• Natural Motion 50%
• Separate Reference 50%
• Microscope Objective 50%

Engineering

• Spectral Domain 100%
• Line Field 100%
• Two Dimensional 50%
• Nanometre 50%
• High Resolution 50%
• Multiple Point 50%
• Pathlength 50%
• Phase Noise 50%
• Numerical Aperture 50%
• Reference Arm 50%
• Dimensional Surface 50%
• Hela Cell 50%
• Common Mode 50%

Physics

• Coherence 100%
• High Resolution 100%
• Tomography 100%
• Numerical Aperture 100%
• Locomotion 100%