In situ x-ray studies of oxygen surface exchange behavior in thin film La 0.6Sr 0.4Co 0.2Fe 0.8O 3-δ

B. J. Ingram; J. A. Eastman; K. C. Chang; S. K. Kim; T. T. Fister; E. Perret; H. You; P. M. Baldo; P. H. Fuoss

doi:10.1063/1.4739518

In situ x-ray studies of oxygen surface exchange behavior in thin film La _0.6Sr _0.4Co _0.2Fe _0.8O _3-δ

B. J. Ingram^*
, J. A. Eastman
, K. C. Chang
, S. K. Kim
, T. T. Fister
, E. Perret
, H. You
, P. M. Baldo
, P. H. Fuoss

^*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

22 Citations (Scopus)

Abstract

In situ synchrotron x-ray techniques were used to investigate oxygen surface exchange behavior in thin film La _0.6Sr _0.4Co _0.2Fe _0.8O _3-δ (LSCF)/Gd ₂O ₃-doped CeO ₂/Y ₂O ₃-stabilized ZrO ₂ heterostructures. Applying electrical potentials across the heterostructures results in significant expansion or contraction of the out-of-plane LSCF lattice parameter, indicating changes in the LSCF oxygen vacancy concentration. Oxygen transport across the LSCF/atmosphere interface is found to be rate limiting under both cathodic and anodic conditions.

Original language	English
Article number	051603
Journal	Applied Physics Letters
Volume	101
Issue number	5
DOIs	https://doi.org/10.1063/1.4739518
Publication status	Published - 2012 Jul 30
Externally published	Yes

ASJC Scopus subject areas

Physics and Astronomy (miscellaneous)

Access to Document

10.1063/1.4739518

Cite this

@article{ffb92b1f087b44faa33781328e3a6a4a,

title = "In situ x-ray studies of oxygen surface exchange behavior in thin film La 0.6Sr 0.4Co 0.2Fe 0.8O 3-δ ",

abstract = "In situ synchrotron x-ray techniques were used to investigate oxygen surface exchange behavior in thin film La 0.6Sr 0.4Co 0.2Fe 0.8O 3-δ (LSCF)/Gd 2O 3-doped CeO 2/Y 2O 3-stabilized ZrO 2 heterostructures. Applying electrical potentials across the heterostructures results in significant expansion or contraction of the out-of-plane LSCF lattice parameter, indicating changes in the LSCF oxygen vacancy concentration. Oxygen transport across the LSCF/atmosphere interface is found to be rate limiting under both cathodic and anodic conditions.",

author = "Ingram, \{B. J.\} and Eastman, \{J. A.\} and Chang, \{K. C.\} and Kim, \{S. K.\} and Fister, \{T. T.\} and E. Perret and H. You and Baldo, \{P. M.\} and Fuoss, \{P. H.\}",

year = "2012",

month = jul,

day = "30",

doi = "10.1063/1.4739518",

language = "English",

volume = "101",

journal = "Applied Physics Letters",

issn = "0003-6951",

publisher = "American Institute of Physics",

number = "5",

}

TY - JOUR

T1 - In situ x-ray studies of oxygen surface exchange behavior in thin film La 0.6Sr 0.4Co 0.2Fe 0.8O 3-δ

AU - Ingram, B. J.

AU - Eastman, J. A.

AU - Chang, K. C.

AU - Kim, S. K.

AU - Fister, T. T.

AU - Perret, E.

AU - You, H.

AU - Baldo, P. M.

AU - Fuoss, P. H.

PY - 2012/7/30

Y1 - 2012/7/30

N2 - In situ synchrotron x-ray techniques were used to investigate oxygen surface exchange behavior in thin film La 0.6Sr 0.4Co 0.2Fe 0.8O 3-δ (LSCF)/Gd 2O 3-doped CeO 2/Y 2O 3-stabilized ZrO 2 heterostructures. Applying electrical potentials across the heterostructures results in significant expansion or contraction of the out-of-plane LSCF lattice parameter, indicating changes in the LSCF oxygen vacancy concentration. Oxygen transport across the LSCF/atmosphere interface is found to be rate limiting under both cathodic and anodic conditions.

AB - In situ synchrotron x-ray techniques were used to investigate oxygen surface exchange behavior in thin film La 0.6Sr 0.4Co 0.2Fe 0.8O 3-δ (LSCF)/Gd 2O 3-doped CeO 2/Y 2O 3-stabilized ZrO 2 heterostructures. Applying electrical potentials across the heterostructures results in significant expansion or contraction of the out-of-plane LSCF lattice parameter, indicating changes in the LSCF oxygen vacancy concentration. Oxygen transport across the LSCF/atmosphere interface is found to be rate limiting under both cathodic and anodic conditions.

UR - https://www.scopus.com/pages/publications/84864712472

U2 - 10.1063/1.4739518

DO - 10.1063/1.4739518

M3 - Article

AN - SCOPUS:84864712472

SN - 0003-6951

VL - 101

JO - Applied Physics Letters

JF - Applied Physics Letters

IS - 5

M1 - 051603

ER -

In situ x-ray studies of oxygen surface exchange behavior in thin film La _0.6Sr _0.4Co _0.2Fe _0.8O _3-δ

Abstract

ASJC Scopus subject areas

Access to Document

Other files and links

Fingerprint

Cite this