Industrial experience with cycle error computation of cycle-accurate transaction level models

Junghee Lee, Joonhwan Yi

Research output: Chapter in Book/Report/Conference proceedingConference contribution


Transaction level modeling is gaining increasing popularity with the increasing design complexity of the system-on-a-chip. Transaction level models are frequently built from existing register transfer level models, which usually cause cycle errors. Measurable indicators of cycle errors are necessary, and their definitions are important. This paper presents the challenges in cycle error computation and our proposed method, although its effectiveness has not been proved formally. The main contribution of our study is to report an industrial experience with cycle error computation.

Original languageEnglish
Title of host publicationProceedings - 20th Anniversary IEEE International SOC Conference
Number of pages4
Publication statusPublished - 2007
Externally publishedYes
Event20th Anniversary IEEE International SOC Conference - Hsinchu, Taiwan, Province of China
Duration: 2007 Sept 262007 Sept 29

Publication series

NameProceedings - 20th Anniversary IEEE International SOC Conference


Conference20th Anniversary IEEE International SOC Conference
Country/TerritoryTaiwan, Province of China

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

Cite this