Industrial experience with cycle error computation of cycle-accurate transaction level models

Junghee Lee; Joonhwan Yi

doi:10.1109/SOCC.2007.4545448

Industrial experience with cycle error computation of cycle-accurate transaction level models

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

Transaction level modeling is gaining increasing popularity with the increasing design complexity of the system-on-a-chip. Transaction level models are frequently built from existing register transfer level models, which usually cause cycle errors. Measurable indicators of cycle errors are necessary, and their definitions are important. This paper presents the challenges in cycle error computation and our proposed method, although its effectiveness has not been proved formally. The main contribution of our study is to report an industrial experience with cycle error computation.

Original language	English
Title of host publication	Proceedings - 20th Anniversary IEEE International SOC Conference
Pages	155-158
Number of pages	4
DOIs	https://doi.org/10.1109/SOCC.2007.4545448
Publication status	Published - 2007
Externally published	Yes
Event	20th Anniversary IEEE International SOC Conference - Hsinchu, Taiwan, Province of China Duration: 2007 Sept 26 → 2007 Sept 29

Publication series

Name	Proceedings - 20th Anniversary IEEE International SOC Conference

Conference

Conference	20th Anniversary IEEE International SOC Conference
Country/Territory	Taiwan, Province of China
City	Hsinchu
Period	07/9/26 → 07/9/29

ASJC Scopus subject areas

Electrical and Electronic Engineering

Access to Document

10.1109/SOCC.2007.4545448

Cite this

Industrial experience with cycle error computation of cycle-accurate transaction level models. / Lee, Junghee; Yi, Joonhwan.
Proceedings - 20th Anniversary IEEE International SOC Conference. 2007. p. 155-158 4545448 (Proceedings - 20th Anniversary IEEE International SOC Conference).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Lee, J & Yi, J 2007, Industrial experience with cycle error computation of cycle-accurate transaction level models. in Proceedings - 20th Anniversary IEEE International SOC Conference., 4545448, Proceedings - 20th Anniversary IEEE International SOC Conference, pp. 155-158, 20th Anniversary IEEE International SOC Conference, Hsinchu, Taiwan, Province of China, 07/9/26. https://doi.org/10.1109/SOCC.2007.4545448

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AB - Transaction level modeling is gaining increasing popularity with the increasing design complexity of the system-on-a-chip. Transaction level models are frequently built from existing register transfer level models, which usually cause cycle errors. Measurable indicators of cycle errors are necessary, and their definitions are important. This paper presents the challenges in cycle error computation and our proposed method, although its effectiveness has not been proved formally. The main contribution of our study is to report an industrial experience with cycle error computation.

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Industrial experience with cycle error computation of cycle-accurate transaction level models

Abstract

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Conference

ASJC Scopus subject areas

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