Abstract
The effect of annealing treatments (at T=250 °C) on both the structural and magnetic properties of sputtered (Co(dCo)/Au(22 Å))×30 multilayers with dCo=6, 9 and 12 Å was studied. X-ray reflectivity and high angle diffraction measurements allowed us to estimate bilayer thickness and interface quality of the multilayers. Magnetic characterization, performed by alternating gradient force magnetometry, magnetic force microscopy and Brillouin light scattering from spin waves, indicates that all the as-prepared samples display perpendicular anisotropy. Upon annealing the perpendicular anisotropy for dCo=9 and 12 Å multilayers is enhanced while it is weakened for dCo=6 Å.
Original language | English |
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Pages (from-to) | 102-106 |
Number of pages | 5 |
Journal | Thin Solid Films |
Volume | 428 |
Issue number | 1-2 |
DOIs | |
Publication status | Published - 2003 Mar 20 |
Event | Proceedings of Symposium J on Growth and Evolution - Strasbourg, France Duration: 2002 Jun 18 → 2002 Jun 21 |
Keywords
- Annealing
- Magnetic force microscopy
- Magnetic multilayers
- Perpendicular magnetic anisotropy
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Surfaces and Interfaces
- Surfaces, Coatings and Films
- Metals and Alloys
- Materials Chemistry