TY - JOUR
T1 - Influence of background oxygen pressure on film properties of pulsed laser deposited Y:BaZrO3
AU - Bae, Kiho
AU - Jang, Dong Young
AU - Choi, Sung Min
AU - Kim, Byung Kook
AU - Lee, Jong Ho
AU - Son, Ji Won
AU - Shim, Joon Hyung
N1 - Funding Information:
We are grateful to the Fusion Research Program for Green Technologies of the National Research Foundation (NRF), Korea, funded by the Ministry of Education, Science, and Technology (Grant No. NRF-2011-0019300 ) and to the Young Fellow Program of the Korea Institute of Science and Technology (KIST) for their financial support.
PY - 2014/2/3
Y1 - 2014/2/3
N2 - Yttrium-doped barium zirconate (Y:BaZrO3, BZY) thin films were prepared using pulsed laser deposition (PLD) on MgO substrates at 700 C by varying the ambient oxygen pressure. The microstructure and electrical properties were then investigated using transmission electron microscopy and electrochemical impedance spectroscopy. Dense, well-crystallized BZY films were produced at ambient oxygen pressures (Pamb,O2) of ≤ 6.67 Pa. At Pamb,O2 ≥ 13.3 Pa, conical amorphous defects and porous microstructures were observed in the films. The conductivity of PLD BZY prepared at Pamb,O2 ≤ 13.3 Pa was measured to be close to that of reference polycrystalline BZY films, and the grain-boundary properties governed the overall ion conduction, with nano-grains being covered by the space charge depletion zones. At Pamb,O2 ≥ 13.3 Pa, microstructural defects significantly degraded the electrical properties.
AB - Yttrium-doped barium zirconate (Y:BaZrO3, BZY) thin films were prepared using pulsed laser deposition (PLD) on MgO substrates at 700 C by varying the ambient oxygen pressure. The microstructure and electrical properties were then investigated using transmission electron microscopy and electrochemical impedance spectroscopy. Dense, well-crystallized BZY films were produced at ambient oxygen pressures (Pamb,O2) of ≤ 6.67 Pa. At Pamb,O2 ≥ 13.3 Pa, conical amorphous defects and porous microstructures were observed in the films. The conductivity of PLD BZY prepared at Pamb,O2 ≤ 13.3 Pa was measured to be close to that of reference polycrystalline BZY films, and the grain-boundary properties governed the overall ion conduction, with nano-grains being covered by the space charge depletion zones. At Pamb,O2 ≥ 13.3 Pa, microstructural defects significantly degraded the electrical properties.
KW - Electrochemical impedance spectroscopy
KW - Grain-boundary depletion
KW - Oxygen pressure
KW - Proton-conducting ceramics
KW - Pulse-laser deposition
KW - Solid oxide fuel cells
KW - Transmission electron microscopy
KW - Yttrium-doped barium zirconate
UR - http://www.scopus.com/inward/record.url?scp=84892825573&partnerID=8YFLogxK
U2 - 10.1016/j.tsf.2013.12.006
DO - 10.1016/j.tsf.2013.12.006
M3 - Article
AN - SCOPUS:84892825573
SN - 0040-6090
VL - 552
SP - 24
EP - 31
JO - Thin Solid Films
JF - Thin Solid Films
ER -