Influence of background oxygen pressure on film properties of pulsed laser deposited Y:BaZrO3

Kiho Bae, Dong Young Jang, Sung Min Choi, Byung Kook Kim, Jong Ho Lee, Ji Won Son, Joon Hyung Shim

Research output: Contribution to journalArticlepeer-review

19 Citations (Scopus)


Yttrium-doped barium zirconate (Y:BaZrO3, BZY) thin films were prepared using pulsed laser deposition (PLD) on MgO substrates at 700 C by varying the ambient oxygen pressure. The microstructure and electrical properties were then investigated using transmission electron microscopy and electrochemical impedance spectroscopy. Dense, well-crystallized BZY films were produced at ambient oxygen pressures (Pamb,O2) of ≤ 6.67 Pa. At Pamb,O2 ≥ 13.3 Pa, conical amorphous defects and porous microstructures were observed in the films. The conductivity of PLD BZY prepared at Pamb,O2 ≤ 13.3 Pa was measured to be close to that of reference polycrystalline BZY films, and the grain-boundary properties governed the overall ion conduction, with nano-grains being covered by the space charge depletion zones. At Pamb,O2 ≥ 13.3 Pa, microstructural defects significantly degraded the electrical properties.

Original languageEnglish
Pages (from-to)24-31
Number of pages8
JournalThin Solid Films
Publication statusPublished - 2014 Feb 3


  • Electrochemical impedance spectroscopy
  • Grain-boundary depletion
  • Oxygen pressure
  • Proton-conducting ceramics
  • Pulse-laser deposition
  • Solid oxide fuel cells
  • Transmission electron microscopy
  • Yttrium-doped barium zirconate

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films
  • Metals and Alloys
  • Materials Chemistry


Dive into the research topics of 'Influence of background oxygen pressure on film properties of pulsed laser deposited Y:BaZrO3'. Together they form a unique fingerprint.

Cite this