Influence of background oxygen pressure on film properties of pulsed laser deposited Y:BaZrO3

Kiho Bae; Dong Young Jang; Sung Min Choi; Byung Kook Kim; Jong Ho Lee; Ji Won Son; Joon Hyung Shim

doi:10.1016/j.tsf.2013.12.006

Influence of background oxygen pressure on film properties of pulsed laser deposited Y:BaZrO₃

Kiho Bae, Dong Young Jang, Sung Min Choi, Byung Kook Kim, Jong Ho Lee, Ji Won Son, Joon Hyung Shim

Research output: Contribution to journal › Article › peer-review

20 Citations (Scopus)

Abstract

Yttrium-doped barium zirconate (Y:BaZrO₃, BZY) thin films were prepared using pulsed laser deposition (PLD) on MgO substrates at 700 C by varying the ambient oxygen pressure. The microstructure and electrical properties were then investigated using transmission electron microscopy and electrochemical impedance spectroscopy. Dense, well-crystallized BZY films were produced at ambient oxygen pressures (P_amb,O2) of ≤ 6.67 Pa. At P_amb,O2 ≥ 13.3 Pa, conical amorphous defects and porous microstructures were observed in the films. The conductivity of PLD BZY prepared at P_amb,O2 ≤ 13.3 Pa was measured to be close to that of reference polycrystalline BZY films, and the grain-boundary properties governed the overall ion conduction, with nano-grains being covered by the space charge depletion zones. At P_amb,O2 ≥ 13.3 Pa, microstructural defects significantly degraded the electrical properties.

Original language	English
Pages (from-to)	24-31
Number of pages	8
Journal	Thin Solid Films
Volume	552
DOIs	https://doi.org/10.1016/j.tsf.2013.12.006
Publication status	Published - 2014 Feb 3

Bibliographical note

Funding Information:
We are grateful to the Fusion Research Program for Green Technologies of the National Research Foundation (NRF), Korea, funded by the Ministry of Education, Science, and Technology (Grant No. NRF-2011-0019300 ) and to the Young Fellow Program of the Korea Institute of Science and Technology (KIST) for their financial support.

Keywords

Electrochemical impedance spectroscopy
Grain-boundary depletion
Oxygen pressure
Proton-conducting ceramics
Pulse-laser deposition
Solid oxide fuel cells
Transmission electron microscopy
Yttrium-doped barium zirconate

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Surfaces and Interfaces
Surfaces, Coatings and Films
Metals and Alloys
Materials Chemistry

Access to Document

10.1016/j.tsf.2013.12.006

Cite this

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title = "Influence of background oxygen pressure on film properties of pulsed laser deposited Y:BaZrO3",

abstract = "Yttrium-doped barium zirconate (Y:BaZrO3, BZY) thin films were prepared using pulsed laser deposition (PLD) on MgO substrates at 700 C by varying the ambient oxygen pressure. The microstructure and electrical properties were then investigated using transmission electron microscopy and electrochemical impedance spectroscopy. Dense, well-crystallized BZY films were produced at ambient oxygen pressures (Pamb,O2) of ≤ 6.67 Pa. At Pamb,O2 ≥ 13.3 Pa, conical amorphous defects and porous microstructures were observed in the films. The conductivity of PLD BZY prepared at Pamb,O2 ≤ 13.3 Pa was measured to be close to that of reference polycrystalline BZY films, and the grain-boundary properties governed the overall ion conduction, with nano-grains being covered by the space charge depletion zones. At Pamb,O2 ≥ 13.3 Pa, microstructural defects significantly degraded the electrical properties.",

keywords = "Electrochemical impedance spectroscopy, Grain-boundary depletion, Oxygen pressure, Proton-conducting ceramics, Pulse-laser deposition, Solid oxide fuel cells, Transmission electron microscopy, Yttrium-doped barium zirconate",

author = "Kiho Bae and Jang, {Dong Young} and Choi, {Sung Min} and Kim, {Byung Kook} and Lee, {Jong Ho} and Son, {Ji Won} and Shim, {Joon Hyung}",

note = "Funding Information: We are grateful to the Fusion Research Program for Green Technologies of the National Research Foundation (NRF), Korea, funded by the Ministry of Education, Science, and Technology (Grant No. NRF-2011-0019300 ) and to the Young Fellow Program of the Korea Institute of Science and Technology (KIST) for their financial support.",

year = "2014",

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doi = "10.1016/j.tsf.2013.12.006",

language = "English",

volume = "552",

pages = "24--31",

journal = "Thin Solid Films",

issn = "0040-6090",

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TY - JOUR

T1 - Influence of background oxygen pressure on film properties of pulsed laser deposited Y:BaZrO3

AU - Bae, Kiho

AU - Jang, Dong Young

AU - Choi, Sung Min

AU - Kim, Byung Kook

AU - Lee, Jong Ho

AU - Son, Ji Won

AU - Shim, Joon Hyung

N1 - Funding Information: We are grateful to the Fusion Research Program for Green Technologies of the National Research Foundation (NRF), Korea, funded by the Ministry of Education, Science, and Technology (Grant No. NRF-2011-0019300 ) and to the Young Fellow Program of the Korea Institute of Science and Technology (KIST) for their financial support.

PY - 2014/2/3

Y1 - 2014/2/3

N2 - Yttrium-doped barium zirconate (Y:BaZrO3, BZY) thin films were prepared using pulsed laser deposition (PLD) on MgO substrates at 700 C by varying the ambient oxygen pressure. The microstructure and electrical properties were then investigated using transmission electron microscopy and electrochemical impedance spectroscopy. Dense, well-crystallized BZY films were produced at ambient oxygen pressures (Pamb,O2) of ≤ 6.67 Pa. At Pamb,O2 ≥ 13.3 Pa, conical amorphous defects and porous microstructures were observed in the films. The conductivity of PLD BZY prepared at Pamb,O2 ≤ 13.3 Pa was measured to be close to that of reference polycrystalline BZY films, and the grain-boundary properties governed the overall ion conduction, with nano-grains being covered by the space charge depletion zones. At Pamb,O2 ≥ 13.3 Pa, microstructural defects significantly degraded the electrical properties.

AB - Yttrium-doped barium zirconate (Y:BaZrO3, BZY) thin films were prepared using pulsed laser deposition (PLD) on MgO substrates at 700 C by varying the ambient oxygen pressure. The microstructure and electrical properties were then investigated using transmission electron microscopy and electrochemical impedance spectroscopy. Dense, well-crystallized BZY films were produced at ambient oxygen pressures (Pamb,O2) of ≤ 6.67 Pa. At Pamb,O2 ≥ 13.3 Pa, conical amorphous defects and porous microstructures were observed in the films. The conductivity of PLD BZY prepared at Pamb,O2 ≤ 13.3 Pa was measured to be close to that of reference polycrystalline BZY films, and the grain-boundary properties governed the overall ion conduction, with nano-grains being covered by the space charge depletion zones. At Pamb,O2 ≥ 13.3 Pa, microstructural defects significantly degraded the electrical properties.

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KW - Oxygen pressure

KW - Proton-conducting ceramics

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KW - Solid oxide fuel cells

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KW - Yttrium-doped barium zirconate

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