Influence of edge termination geometry on performance of 4H-SiC p-i-n rectifiers

S. Nigam, Jihyun Kim, B. Luo, F. Ren, G. Y. Chung, S. J. Pearton, J. R. Williams, K. Shenai, P. Neudeck

Research output: Contribution to journalArticlepeer-review

2 Citations (Scopus)

Fingerprint

Dive into the research topics of 'Influence of edge termination geometry on performance of 4H-SiC p-i-n rectifiers'. Together they form a unique fingerprint.

Physics & Astronomy

Chemical Compounds

Engineering & Materials Science