Influence of stabilizer thickness on over-current test of YBCO-coated conductors

N. Y. Kwon, H. S. Kim, K. L. Kim, S. W. Yim, H. R. Kim, O. B. Hyun, H. M. Kim, H. G. Lee

    Research output: Contribution to journal › Article › peer-review

    23 Citations (Scopus)

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    Material Science