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Influence of the density of crack-initiating defects on crack spacing for GaN films on Si(111) substrate
Bumjoon Kim, Samseok Jang, Junggeun Jhin, Seungjae Lee, Jong Hyeob Baek, Youngmoon Yu, Jaesang Lee, Dongjin Byun
Research output: Contribution to journal › Article › peer-review
2
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(Scopus)