Single-particle tracking is a powerful technique to reveal an underlying principle of microscopic phenomena. Here we report an optical microscopy technique, polarization-selective interferometric scattering microscopy, that enables us to capture rotational as well as positional information on nanoscale objects. This technique grants all the merits of interferometric scattering microscopy and provides a further advantage of the capability of determining the orientation of single nanoscopic objects in a straightforward and facile way. We anticipate that this technique would be of critical use in rotational tracking of a single anisotropic particle or biological system in the nanoscopic world.
Bibliographical noteFunding Information:
This work was supported by IBS-R023-D1. This work was also partly supported by NRF-2016R1A2B4014855 (S.-C.H.)
© 2017 American Chemical Society.
- Interference microscopy
- orientation of nano-objects
- polarization measurement
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Atomic and Molecular Physics, and Optics
- Electrical and Electronic Engineering