Interlayer exchange coupling between perpendicularly magnetized structures through a Ru/Ta composite spacer

Seok Jin Yun; Sang Ho Lim; Seong Rae Lee

doi:10.1063/1.4916731

Interlayer exchange coupling between perpendicularly magnetized structures through a Ru/Ta composite spacer

Seok Jin Yun, Sang Ho Lim, Seong Rae Lee

Department of Materials Science and Engineering

Research output: Contribution to journal › Article › peer-review

7 Citations (Scopus)

Abstract

In stacks using a Ru/Ta composite spacer [Pt/Co]₆/Ru/Ta/CoFeB/MgO, both strong interlayer exchange coupling and perpendicular magnetic anisotropy are achieved. The composite spacer has the additional advantages of high post-annealing stability over a conventional Ru spacer; for a Ru (0.8 nm)/Ta (0.4 nm) spacer, where the antiparallel coupling is strongest, the coupling strength remains nearly constant at the highest annealing temperature of 375 °C. An interlayer exchange coupling is observed at very small Ru thicknesses down to 0.2 nm, which can be compared with the previous limit of 0.6 nm.

Original language	English
Article number	132401
Journal	Applied Physics Letters
Volume	106
Issue number	13
DOIs	https://doi.org/10.1063/1.4916731
Publication status	Published - 2015 Mar 30

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© 2015 AIP Publishing LLC.

ASJC Scopus subject areas

Physics and Astronomy (miscellaneous)

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10.1063/1.4916731

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@article{812a6bc2976f44e6a00c6ea3d1f3b653,

title = "Interlayer exchange coupling between perpendicularly magnetized structures through a Ru/Ta composite spacer",

abstract = "In stacks using a Ru/Ta composite spacer [Pt/Co]6/Ru/Ta/CoFeB/MgO, both strong interlayer exchange coupling and perpendicular magnetic anisotropy are achieved. The composite spacer has the additional advantages of high post-annealing stability over a conventional Ru spacer; for a Ru (0.8 nm)/Ta (0.4 nm) spacer, where the antiparallel coupling is strongest, the coupling strength remains nearly constant at the highest annealing temperature of 375 °C. An interlayer exchange coupling is observed at very small Ru thicknesses down to 0.2 nm, which can be compared with the previous limit of 0.6 nm.",

author = "Yun, {Seok Jin} and Lim, {Sang Ho} and Lee, {Seong Rae}",

note = "Publisher Copyright: {\textcopyright} 2015 AIP Publishing LLC.",

year = "2015",

month = mar,

day = "30",

doi = "10.1063/1.4916731",

language = "English",

volume = "106",

journal = "Applied Physics Letters",

issn = "0003-6951",

publisher = "American Institute of Physics Publising LLC",

number = "13",

}

TY - JOUR

T1 - Interlayer exchange coupling between perpendicularly magnetized structures through a Ru/Ta composite spacer

AU - Yun, Seok Jin

AU - Lim, Sang Ho

AU - Lee, Seong Rae

PY - 2015/3/30

Y1 - 2015/3/30

N2 - In stacks using a Ru/Ta composite spacer [Pt/Co]6/Ru/Ta/CoFeB/MgO, both strong interlayer exchange coupling and perpendicular magnetic anisotropy are achieved. The composite spacer has the additional advantages of high post-annealing stability over a conventional Ru spacer; for a Ru (0.8 nm)/Ta (0.4 nm) spacer, where the antiparallel coupling is strongest, the coupling strength remains nearly constant at the highest annealing temperature of 375 °C. An interlayer exchange coupling is observed at very small Ru thicknesses down to 0.2 nm, which can be compared with the previous limit of 0.6 nm.

AB - In stacks using a Ru/Ta composite spacer [Pt/Co]6/Ru/Ta/CoFeB/MgO, both strong interlayer exchange coupling and perpendicular magnetic anisotropy are achieved. The composite spacer has the additional advantages of high post-annealing stability over a conventional Ru spacer; for a Ru (0.8 nm)/Ta (0.4 nm) spacer, where the antiparallel coupling is strongest, the coupling strength remains nearly constant at the highest annealing temperature of 375 °C. An interlayer exchange coupling is observed at very small Ru thicknesses down to 0.2 nm, which can be compared with the previous limit of 0.6 nm.

UR - http://www.scopus.com/inward/record.url?scp=84961288647&partnerID=8YFLogxK

U2 - 10.1063/1.4916731

DO - 10.1063/1.4916731

M3 - Article

AN - SCOPUS:84961288647

SN - 0003-6951

VL - 106

JO - Applied Physics Letters

JF - Applied Physics Letters

IS - 13

M1 - 132401

ER -

Interlayer exchange coupling between perpendicularly magnetized structures through a Ru/Ta composite spacer

Abstract

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