Abstract
Interlayer exchange coupling (IEC) of GaMnAs-based multilayers has been investigated by varying the structural parameters, such as spacer thickness, carrier doping in the nonmagnetic layers, and repetition number of GaMnAs/GaAs bilayers. The type of IEC in the structure (i.e., either ferromagnetic or antiferromagnetic IEC) was identified from the magnetotransport measurements, which show either anisotropic magnetoresistance or giant magnetoresistance-like behavior. The investigation revealed that the parameters of the ferromagnetic GaMnAs layer (i.e., Mn composition and thickness) are less important than those of the non-magnetic GaAs spacer layer in the structure. In particular, it was found that the presence of carriers in the spacer layer plays a crucial role in determining the type and strength of the IEC in GaMnAs-based multilayer systems.
Original language | English |
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Pages (from-to) | 188-192 |
Number of pages | 5 |
Journal | Journal of Crystal Growth |
Volume | 477 |
DOIs | |
Publication status | Published - 2017 Nov 1 |
Bibliographical note
Publisher Copyright:© 2017
Keywords
- A1. Characterization
- A3. Molecular beam epitaxy
- A3. Superlattices
- B2. Semiconducting III–V materials
ASJC Scopus subject areas
- Condensed Matter Physics
- Inorganic Chemistry
- Materials Chemistry