Internal electric field behavior of cadmium zinc telluride radiation detectors under high carrier injection

  • G. Yang*
  • , A. E. Bolotnikov
  • , G. S. Camarda
  • , Y. Cui
  • , A. Hossain
  • , K. H. Kim
  • , R. Gul
  • , R. B. James
  • *Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

Abstract

The behavior of the internal electric field of nuclear-radiation detectors substantially affects detector performance. We investigated the distribution of the internal field in cadmium zinc telluride (CZT) detectors under high carrier injection. We noted the build-up of a space-charge region near the cathode that produces a built-in field opposing the applied field. Its presence entails the collapse of the electric field in the rest of the detector, other than the portion near the cathode. Such a space-charge region originates from serious hole trapping in CZT. The device's operating temperature greatly affects the width of the space-charge region. With increasing temperature from 5°C to 35°C, its width expanded from about one-sixth to one-half of the total depth of the detector.

Original languageEnglish
Pages (from-to)1689-1692
Number of pages4
JournalJournal of Electronic Materials
Volume40
Issue number8
DOIs
Publication statusPublished - 2011 Aug
Externally publishedYes

Bibliographical note

Funding Information:
This work was supported by US Department of Energy, Office of Nonproliferation Research and Development, NA-22. The manuscript has been authored by Brookhaven Science Associates, LLC under Contract No. DE-AC02-98CH1-886 with the US Department of Energy.

Keywords

  • CZT
  • Pockels effect
  • electric field
  • hole trapping
  • polarization

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Electrical and Electronic Engineering
  • Materials Chemistry

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