Interwall support in double-walled carbon nanotubes studied by scanning tunneling microscopy

Min Hwan Park, Jae Won Jang, Cheol Eui Lee, Cheol Jin Lee

    Research output: Contribution to journalArticlepeer-review

    28 Citations (Scopus)

    Abstract

    Atomically resolved room temperature scanning tunneling microscopy images of carbon nanotubes were obtained, and actual values of the nanotube dimensions were estimated from a line profile fitting analysis. It was found that the cross sectional deformation induced by the van der Waals forces between the CNTs and the substrate is much smaller in the double-walled carbon nanotubes than in the single-walled nanotubes.

    Original languageEnglish
    Article number023110
    Pages (from-to)023110-1-023110-3
    JournalApplied Physics Letters
    Volume86
    Issue number2
    DOIs
    Publication statusPublished - 2005 Jan 10

    Bibliographical note

    Funding Information:
    This work was supported by the KISTEP (National Research Laboratory and Grant No. M102KS010001-02K1901-01814) and the Korea Research Foundation (Brain Korea 21 Project in 2004 and Grant No. KRF-2004-005-C00060). C.J.L. was supported by the Center for Nanotubes and Nanostructured Composites at Sungkyunkwan University.

    ASJC Scopus subject areas

    • Physics and Astronomy (miscellaneous)

    Fingerprint

    Dive into the research topics of 'Interwall support in double-walled carbon nanotubes studied by scanning tunneling microscopy'. Together they form a unique fingerprint.

    Cite this