Investigating the origin of efficiency droop by profiling the temperature across the multi-quantum well of an operating light-emitting diode
- Euihan Jung
- , Gwangseok Hwang
- , Jaehun Chung
- , Oh Myoung Kwon
- , Jaecheon Han
- , Yong Tae Moon
- , Tae Yeon Seong
Research output: Contribution to journal › Article › peer-review
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