Investigation of Surface Sulfurization in CuIn_1−xGa_xS_2−ySe_y Thin Films by Using Kelvin Probe Force Microscopy

Keyphrases

• Scanning Kelvin Probe Force Microscopy (SKPFM) 100%
• Surface Sulfurization 100%
• Surface Modification 66%
• Surface Photovoltage 66%
• Surface Properties 33%
• Efficiency Increase 33%
• Optical Properties 33%
• Microscopic Analysis 33%
• Surface Charge 33%
• Surface Passivation 33%
• Heat Treatment 33%
• Film Surface 33%
• Solar Cell Applications 33%
• Work Function 33%
• Solar Cell Performance 33%
• Solar Cell Efficiency 33%
• High Work Function 33%
• Band Bending 33%
• Precursor Solution 33%
• Solution Process 33%
• Surface Defects 33%
• Absorber Films 33%
• Current-voltage 33%
• Carrier Trapping 33%
• Positively Charged Surface 33%
• Absorbing Materials 33%
• Stable Structure 33%
• Post-heat Treatment 33%
• Direct Band Gap 33%
• Materials for Solar Cells 33%
• Bending Behavior 33%
• Solution Properties 33%
• High Absorption Coefficient 33%
• Post-sulfurization 33%

Engineering

• Thin Films 100%
• Solar Cell 75%
• Heat Treatment 50%
• Surface Photovoltage 50%
• Passivation 25%
• Film Surface 25%
• Band Bending 25%
• Cell Performance 25%
• Precursor Solution 25%
• Great Deal 25%
• Bending Behavior 25%
• Band Gap 25%
• Surface Defect 25%
• Absorptivity 25%
• Absorption Coefficient 25%

Material Science

• Thin Films 100%
• Film 100%
• Solar Cell 75%
• Heat Treatment 50%
• Surface (Surface Science) 50%
• Surface Property 25%
• Optical Property 25%
• Surface Passivation 25%
• Surface Defect 25%
• Surface Charge 25%
• Surface Treatment 25%
• Microscopy 25%