Investigation of the drying temperature dependence of the orientation in sol-gel processed PZT thin films

The crystal orientations of lead zircon ate titan ate (PZT) thin films have been investigated by using various drying temperatures in the sol-gel process. The films were dried at different temperatures between 310 and 350°C for pyrolysis and then were heat treated at 650°C using rapid thermal annealing (RTA). TG/DTA and FTIR spectroscopy were used to detect the remnants of organic materials in the thin films prior to the final heat treatment. In order to examine the relationship between the film orientation and the remaining organic materials for the prior and final heat treatment, the films were fabricated with different coating cycles and dried for different holding times and then annealed at 650°C. The preferred orientations were investigated using X-ray diffraction.