Abstract
To better understand the role of nitrogen (N) during crystallization of Sb-rich phase change materials, a study was conducted using Sb and Sb70 Te30 as host materials of N. Crystallization of the as-sputtered Sb-N films of varying N content was examined to reveal that Sb-N bonds are formed in the as-sputtered states, enhancing amorphous phase stability increasingly with N content. Crystallization appeared to proceed with irreversible dissociation of these bonds to form N2 molecules that may then exist stably during the subsequent memory operations. N2 molecules are considered to play as growth-retarding agents as demonstrated with memory operations of N-doped Sb70 Te30.
Original language | English |
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Article number | 081905 |
Journal | Applied Physics Letters |
Volume | 95 |
Issue number | 8 |
DOIs | |
Publication status | Published - 2009 |
Bibliographical note
Funding Information:The authors would like to acknowledge a research grant by Korean Ministry of Knowledge Economy (MKE) through 0.1 terabit nonvolatile memory (NVM) device program.
Copyright:
Copyright 2009 Elsevier B.V., All rights reserved.
ASJC Scopus subject areas
- Physics and Astronomy (miscellaneous)