Abstract
As the number of devices with software increases, software reliability and security has become more critical. To improve reliability and security, developers and test engineers use static analysis tools to find defects early in the development process. However, it takes a lot of time and effort to determine whether alarms from performing static analysis are true or false positive. In this paper, we argue that all integer overflow generated by static analysis tools are weaknesses and should eventually be corrected. To show that our argument is reasonable, we explain static analysis results for binary search program code and CWE:190 example code in terms of reliability and security. It is unnecessary to identify whether the integer overflow generated by static analysis tools is true or false positive.
| Original language | English |
|---|---|
| Title of host publication | 24th International Conference on Advanced Communication Technology |
| Subtitle of host publication | Artificial Intelligence Technologies toward Cybersecurity!!, ICACT 2022 - Proceedings |
| Publisher | Institute of Electrical and Electronics Engineers Inc. |
| Pages | 145-149 |
| Number of pages | 5 |
| ISBN (Electronic) | 9791188428090 |
| DOIs | |
| Publication status | Published - 2022 |
| Event | 24th International Conference on Advanced Communication Technology, ICACT 2022 - Virtual, Online, Korea, Republic of Duration: 2022 Feb 13 → 2022 Feb 16 |
Publication series
| Name | International Conference on Advanced Communication Technology, ICACT |
|---|---|
| Volume | 2022-February |
| ISSN (Print) | 1738-9445 |
Conference
| Conference | 24th International Conference on Advanced Communication Technology, ICACT 2022 |
|---|---|
| Country/Territory | Korea, Republic of |
| City | Virtual, Online |
| Period | 22/2/13 → 22/2/16 |
Bibliographical note
Publisher Copyright:© 2022 Global IT Research Institute-GiRI.
Keywords
- False Positive
- Integer Overflow
- Software Reliability
- Software Security
- Static Analysis
- True Positive
ASJC Scopus subject areas
- Electrical and Electronic Engineering