Abstract
A lateral force microscope (LFM) was used for studying the surface morphologies of SrBi2Ta2O9 thin films with varying post-annealing temperature. Specimens were prepared onto platinized silicon wafers by the sol-gel method and post-annealed at 600-800°C. Non-ferroelectric matrix phases were found for specimens annealed below 700°C, which were confirmed by the measurement of X-ray diffraction (XRD) patterns. The friction coefficients between the surface of ferroelectric grain and non-ferroelectric matrix, and the silicon nitride tip, were determined from the line profile of the LFM images. The measured coefficients of friction for a tip on grain and matrix are 0.19±0.08 and 0.28±0.08, respectively. In the LFM images, the matrix phases decreased with increasing post-anneal temperature and the surfaces of the specimens annealed above 700°C were filled with SBT grains which were consistent with the XRD results. Ferroelectricities of these specimens were confirmed by the measurement of polarization field hysteresis loops.
Original language | English |
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Pages (from-to) | 65-70 |
Number of pages | 6 |
Journal | Thin Solid Films |
Volume | 334 |
Issue number | 1-2 |
DOIs | |
Publication status | Published - 1998 Dec 4 |
Externally published | Yes |
Bibliographical note
Copyright:Copyright 2018 Elsevier B.V., All rights reserved.
Keywords
- Crystallization
- Lateral force microscopy
- SrBiTaO thin film
- X-ray diffraction
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Surfaces and Interfaces
- Surfaces, Coatings and Films
- Metals and Alloys
- Materials Chemistry