Lateral force microscopy investigations of the crystallization of SrBi₂Ta₂O₉ thin films

Engineering & Materials Science

• Crystallization 67%
• Microscopic examination 67%
• Microscopes 59%
• Thin films 58%
• X ray diffraction 40%
• Ferroelectricity 39%
• Diffraction patterns 29%
• Friction 28%
• Sol-gel process 28%
• Ferroelectric materials 27%
• Silicon nitride 25%
• Hysteresis loops 25%
• Silicon wafers 24%
• Surface morphology 23%
• Annealing 20%
• Polarization 18%
• Temperature 16%

Physics & Astronomy

• crystallization 47%
• microscopy 43%
• microscopes 35%
• matrices 34%
• thin films 31%
• coefficient of friction 30%
• ferroelectricity 17%
• silicon nitrides 15%
• x rays 13%
• diffraction patterns 12%
• gels 12%
• hysteresis 12%
• wafers 11%
• annealing 9%
• temperature 9%
• profiles 8%
• silicon 8%
• polarization 8%
• diffraction 8%

Chemical Compounds

• Lateral Force Microscopy 100%
• Friction Coefficient 44%
• Crystallization 43%
• Force 42%
• X-Ray Diffraction 20%
• Hysteresis 20%
• Nitride 19%
• Surface 19%
• Sol Gel Process 16%
• Polarization 15%