Less mobility degradation induced by transverse electric-field in junctionless transistors

  • So Jeong Park
  • , Dae Young Jeon
  • , Laurent Montes
  • , Mireille Mouis
  • , Sylvain Barraud
  • , Gyu Tae Kim
  • , Gérard Ghibaudo

Research output: Contribution to journal › Article › peer-review

17 Citations (Scopus)

Fingerprint

Dive into the research topics of 'Less mobility degradation induced by transverse electric-field in junctionless transistors'. Together they form a unique fingerprint.

Keyphrases

Engineering

Material Science