Fingerprint
Dive into the research topics of 'Less mobility degradation induced by transverse electric-field in junctionless transistors'. Together they form a unique fingerprint.- Sort by
- Weight
- Alphabetically
Less mobility degradation induced by transverse electric-field in junctionless transistors
So Jeong Park, Dae Young Jeon, Laurent Montes, Mireille Mouis, Sylvain Barraud, Gyu Tae Kim, Gérard Ghibaudo
Research output: Contribution to journal › Article › peer-review
17
Citations
(Scopus)