Local feature-based multi-object recognition scheme for surveillance

Daehoon Kim, Seungmin Rho, Eenjun Hwang

    Research output: Contribution to journalArticlepeer-review

    24 Citations (Scopus)

    Abstract

    In this paper, we propose an efficient multi-object recognition scheme for surveillance based on interest points of objects and their feature descriptors. In this scheme, we first define a set of object types of interest and collect their sample images. For each sample image, we detect interest points and construct their feature descriptors using SURF. Next, we perform a statistical analysis of the local features to select representative points among them. Intuitively, the representative points of an object are the interest points that best characterize the object. Finally, we calculate thresholds of each object for object recognition. User query is processed in a similar way. A given query images local feature descriptors are extracted and then compared with the representative points of objects in the database. Especially, to reduce the number of comparisons required, we propose a method for merging descriptors of similar representative points into a single descriptor. This descriptor is different from typical SURF descriptor in that each element represents not a single value but a range. By using this merged descriptor, we can calculate the similarity between input image descriptor and multiple descriptors in database efficiently. In addition, since our scheme treats all the objects independently, it can recognize multiple objects simultaneously.

    Original languageEnglish
    Pages (from-to)1373-1380
    Number of pages8
    JournalEngineering Applications of Artificial Intelligence
    Volume25
    Issue number7
    DOIs
    Publication statusPublished - 2012 Oct

    Keywords

    • Feature descriptor
    • Local feature
    • Object recognition
    • SURF
    • Surveillance

    ASJC Scopus subject areas

    • Control and Systems Engineering
    • Artificial Intelligence
    • Electrical and Electronic Engineering

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