Abstract
We report on the formation of high-quality p -type Al-based ohmic reflectors using Ag (3 nm) indium tin oxide (ITO) (100 nm) interlayers for use in high-power flip-chip light-emitting diodes (LEDs). The AgITO interlayers are first annealed at temperatures of 530 and 630 °C for 1 min in air, after which Al reflectors (200 nm thick) are deposited and subsequently annealed at 330 °C for 5 min in a vacuum. It is shown that the annealed AgITOAl contacts give specific contact resistances as low as ~ 10-5 Ω cm-2 and reflectance of ~85% at a wavelength of 460 nm, which are much better than those of oxidized NiAu schemes. LEDs fabricated with the annealed AgITOAl p -type electrodes give forward-bias voltages of 3.29-3.37 V at injection current of 20 mA.
| Original language | English |
|---|---|
| Article number | 133503 |
| Pages (from-to) | 1-3 |
| Number of pages | 3 |
| Journal | Applied Physics Letters |
| Volume | 86 |
| Issue number | 13 |
| DOIs | |
| Publication status | Published - 2005 Mar 28 |
| Externally published | Yes |
Bibliographical note
Funding Information:This work was supported by the basic research program of the Korea Science and Engineering Foundation (Grant No. R01-2002-000-00356-0).
ASJC Scopus subject areas
- Physics and Astronomy (miscellaneous)
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