Low temperature characterization of 14nm FDSOI CMOS devices

Keyphrases

• SOI CMOS 100%
• CMOS Devices 100%
• Low Temperature Characterization 100%
• Temperature Effect 50%
• Transfer Characteristics 50%
• Phonon Scattering 50%
• CMOS Technology 50%
• Low Operating Temperature 50%
• Low-field Mobility 50%
• Gate Length 50%
• Good Control 50%
• Short Channel Effects 50%
• Neutral Defects 50%
• MOS Devices 50%
• Subthreshold Activity 50%
• Effective Gate Length 50%

Engineering

• Low-Temperature 100%
• Gate Length 100%
• Good Performance 50%
• Temperature Dependence 50%