Low-temperature performance of yttria-stabilized zirconia prepared by atomic layer deposition

Keyphrases

• Atomic Layer Deposition 100%
• Yttria-stabilized Zirconia 100%
• Low-temperature Performance 100%
• Yttrium Oxide 20%
• Microstructure 20%
• Electrical Properties 20%
• Transmission Electron Microscopy 20%
• X Ray Diffraction 20%
• Atmospheric Conditions 20%
• Power Output 20%
• Electrolyte 20%
• Crystallinity 20%
• Zirconia 20%
• Open-circuit Voltage 20%
• High Conductivity 20%
• Conduction Mechanism 20%
• Electrochemical Impedance Spectroscopy 20%
• Conductivity Measurement 20%
• Electrical Measurements 20%
• Low-temperature Region 20%
• Zirconia Film 20%
• Zirconia Membrane 20%
• Micro-tubular Solid Oxide Fuel Cell (MT-SOFC) 20%
• Experimental Variables 20%
• Conductivity Values 20%

Engineering

• Low-Temperature 100%
• Atomic Layer Deposition 100%
• Yttria-Stabilized Zirconia 100%
• Thin Films 20%
• Ray Diffraction 20%
• Conductivity Measurement 20%
• Open Circuit Voltage 20%
• Solid Oxide Fuel Cell 20%
• Crystallinity 20%
• Temperature Region 20%
• Power Output 20%
• Reference Value 20%
• Experimental Variable 20%
• Electrical Measurement 20%

Material Science

• Yttria Stabilized Zirconia 100%
• Oxide Compound 20%
• Thin Films 20%
• Film 20%
• Transmission Electron Microscopy 20%
• X-Ray Diffraction 20%
• Electronic Circuit 20%
• Zirconia 20%
• Dielectric Spectroscopy 20%
• Yttrium Oxide 20%