Abstract
The structural and magnetic properties of [Co(dCo)/Au(22Å)]×30 multilayers grown by RF sputtering on non-etched Si (1 0 0) substrates have been studied. The thicknesses of the Co layers (dCo) were 6, 9 and 12Å. The magnetic properties were investigated by means of an alternating gradient-force magnetometer and magnetic force microscopy. The domain configuration and its dependence on the thickness of the elemental magnetic layer are shown. In addition, the correlation between the shape of the hysteresis loops and the domain configuration at remanence for both in-plane and perpendicular applied magnetic field is discussed.
Original language | English |
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Pages (from-to) | 526-528 |
Number of pages | 3 |
Journal | Journal of Magnetism and Magnetic Materials |
Volume | 240 |
Issue number | 1-3 |
DOIs | |
Publication status | Published - 2002 Feb |
Keywords
- Magnetic force microscopy
- Magnetic multilayers
- Perpendicular anisotropy
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics