Mapping optimization for space-time bit-interleaved coded modulation with iterative decoding

Wookbong Lee, Jungho Cho, Chang Kyung Sung, Hwangjun Song, Inkyu Lee

Research output: Contribution to journalArticlepeer-review

6 Citations (Scopus)

Abstract

For space-time bit-interleaved coded modulation (ST-BICM) systems with iterative decoding, the overall performance is affected by the chosen mapping. In bit-error rate (BER) curves, one mapping reaches an error floor (EF) at a low signal-to-noise ratio (SNR), while other mappings result in a lower EF at a higher SNR. The constellation mappings are divided into groups where each group exhibits a distinctive BER curve. We show that the convergence abscissa of the system depends on the average total bit errors and the harmonic mean of the minimum squared Euclidean distance. In this letter, we characterize all mapping groups for ST-BICM with 8-phase-shift keying and present the optimal selection for each mapping group over independent fading channels.

Original languageEnglish
Pages (from-to)650-655
Number of pages6
JournalIEEE Transactions on Communications
Volume55
Issue number4
DOIs
Publication statusPublished - 2007 Apr

Bibliographical note

Funding Information:
Paper approved by R. W. Heath, the Editor for MIMO Techniques of the IEEE Communications Society. Manuscript received April 9, 2005; revised February 12, 2006 and June 26, 2006. This work was supported in part by the Ministry of Information and Communication (MIC), Korea, under the Information Technology Research Center (ITRC) support program, supervised by the Institute of Information Technology Assessment (IITA) , and in part by the Basic Research Program of the Korea Science and Engineering Foundation under Grant R01-2006-000-11112-0. This paper was presented in part at the IEEE Vehicular Technology Conference, September 2005.

Keywords

  • Bit-interleaved coded modulation (BICM)
  • Coded modulation
  • Iterative decoding
  • Space-time (ST) code
  • Symbol labeling

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

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