Microscopic domain structure in unidirectional and isotropic exchange-coupled NiO/NiFe bilayers

D. G. Hwang, J. K. Kim, S. S. Lee, H. Koo, S. H. Chung, Michael Dreyer, R. D. Gomez

    Research output: Contribution to journalConference articlepeer-review

    Abstract

    The microscopic domain structure in unidirectional and isotropic exchange-coupled NiO/NiFe bilayers was investigated. The thickness effect of NiO and NiFe on the microscopic domain structure and magnetization reversal in a unidirectional and isotropic exchange-coupled films were also studied. The results showed that the density of the cross-type domain was found to be proportional to exchange basing field.

    Original languageEnglish
    Pages (from-to)ES04
    JournalDigests of the Intermag Conference
    Publication statusPublished - 2002
    Event2002 IEEE International Magnetics Conference-2002 IEEE INTERMAG - Amsterdam, Netherlands
    Duration: 2002 Apr 282002 May 2

    ASJC Scopus subject areas

    • Electronic, Optical and Magnetic Materials
    • Surfaces, Coatings and Films
    • Surfaces and Interfaces

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