Microscopic domain structure in unidirectional and isotropic exchange-coupled NiO/NiFe bilayers

D. G. Hwang; J. K. Kim; S. S. Lee; H. Koo; S. H. Chung; Michael Dreyer; R. D. Gomez

Microscopic domain structure in unidirectional and isotropic exchange-coupled NiO/NiFe bilayers

D. G. Hwang, J. K. Kim, S. S. Lee, H. Koo, S. H. Chung, Michael Dreyer, R. D. Gomez

Research output: Contribution to journal › Conference article › peer-review

Abstract

The microscopic domain structure in unidirectional and isotropic exchange-coupled NiO/NiFe bilayers was investigated. The thickness effect of NiO and NiFe on the microscopic domain structure and magnetization reversal in a unidirectional and isotropic exchange-coupled films were also studied. The results showed that the density of the cross-type domain was found to be proportional to exchange basing field.

Original language	English
Pages (from-to)	ES04
Journal	Digests of the Intermag Conference
Publication status	Published - 2002
Externally published	Yes
Event	2002 IEEE International Magnetics Conference-2002 IEEE INTERMAG - Amsterdam, Netherlands Duration: 2002 Apr 28 → 2002 May 2

ASJC Scopus subject areas

Electrical and Electronic Engineering

Cite this

@article{24e686a90d8c4714bd4d5cc100afa889,

title = "Microscopic domain structure in unidirectional and isotropic exchange-coupled NiO/NiFe bilayers",

abstract = "The microscopic domain structure in unidirectional and isotropic exchange-coupled NiO/NiFe bilayers was investigated. The thickness effect of NiO and NiFe on the microscopic domain structure and magnetization reversal in a unidirectional and isotropic exchange-coupled films were also studied. The results showed that the density of the cross-type domain was found to be proportional to exchange basing field.",

author = "Hwang, {D. G.} and Kim, {J. K.} and Lee, {S. S.} and H. Koo and Chung, {S. H.} and Michael Dreyer and Gomez, {R. D.}",

year = "2002",

language = "English",

pages = "ES04",

journal = "Digests of the Intermag Conference",

issn = "0074-6843",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

note = "2002 IEEE International Magnetics Conference-2002 IEEE INTERMAG ; Conference date: 28-04-2002 Through 02-05-2002",

}

TY - JOUR

T1 - Microscopic domain structure in unidirectional and isotropic exchange-coupled NiO/NiFe bilayers

AU - Hwang, D. G.

AU - Kim, J. K.

AU - Lee, S. S.

AU - Koo, H.

AU - Chung, S. H.

AU - Dreyer, Michael

AU - Gomez, R. D.

PY - 2002

Y1 - 2002

N2 - The microscopic domain structure in unidirectional and isotropic exchange-coupled NiO/NiFe bilayers was investigated. The thickness effect of NiO and NiFe on the microscopic domain structure and magnetization reversal in a unidirectional and isotropic exchange-coupled films were also studied. The results showed that the density of the cross-type domain was found to be proportional to exchange basing field.

AB - The microscopic domain structure in unidirectional and isotropic exchange-coupled NiO/NiFe bilayers was investigated. The thickness effect of NiO and NiFe on the microscopic domain structure and magnetization reversal in a unidirectional and isotropic exchange-coupled films were also studied. The results showed that the density of the cross-type domain was found to be proportional to exchange basing field.

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UR - http://www.scopus.com/inward/citedby.url?scp=20244383565&partnerID=8YFLogxK

M3 - Conference article

AN - SCOPUS:20244383565

SN - 0074-6843

SP - ES04

JO - Digests of the Intermag Conference

JF - Digests of the Intermag Conference

T2 - 2002 IEEE International Magnetics Conference-2002 IEEE INTERMAG

Y2 - 28 April 2002 through 2 May 2002

ER -

Microscopic domain structure in unidirectional and isotropic exchange-coupled NiO/NiFe bilayers

Abstract

ASJC Scopus subject areas

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