Microscopic domain structure in unidirectional and isotropic exchange-coupled NiO/NiFe bilayers

D. G. Hwang; J. K. Kim; S. S. Lee; H. Koo; S. H. Chung; M. Dreyer; R. D. Gomez

doi:10.1109/INTMAG.2002.1001190

Microscopic domain structure in unidirectional and isotropic exchange-coupled NiO/NiFe bilayers

D. G. Hwang
, J. K. Kim
, S. S. Lee
, H. Koo
, S. H. Chung
, M. Dreyer
, R. D. Gomez

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

The authors studied the thickness effect of NiO and NiFe on the microscopic domain structure and magnetization reversal in unidirectional and isotropic exchange-coupled NiO(0-60 nm)/NiFe(5-10 nm) films using magnetic force microscopy. As the NiO thickness increases, the microscopic domain structure of the unidirectional biased film changed from a mesh-type ripple pattern with no NiO to a more complicated and coarse-grained ripple structure at 60 nm. On the other hand, for the isotropic exchange coupled film, we observed a new cross-type domain with out-of plane magnetization.

Original language	English
Title of host publication	INTERMAG Europe 2002 - IEEE International Magnetics Conference
Editors	J. Fidler, B. Hillebrands, C. Ross, D. Weller, L. Folks, E. Hill, M. Vazquez Villalabeitia, J. A. Bain, Jo De Boeck, R. Wood
Publisher	Institute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)	0780373650, 9780780373655
DOIs	https://doi.org/10.1109/INTMAG.2002.1001190
Publication status	Published - 2002
Event	2002 IEEE International Magnetics Conference, INTERMAG Europe 2002 - Amsterdam, Netherlands Duration: 2002 Apr 28 → 2002 May 2

Publication series

Name	INTERMAG Europe 2002 - IEEE International Magnetics Conference

Other

Other	2002 IEEE International Magnetics Conference, INTERMAG Europe 2002
Country/Territory	Netherlands
City	Amsterdam
Period	02/4/28 → 02/5/2

Bibliographical note

Publisher Copyright:
©2002 IEEE.

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Electrical and Electronic Engineering
Surfaces, Coatings and Films

Access to Document

10.1109/INTMAG.2002.1001190

Cite this

Hwang, D. G., Kim, J. K., Lee, S. S., Koo, H., Chung, S. H., Dreyer, M., & Gomez, R. D. (2002). Microscopic domain structure in unidirectional and isotropic exchange-coupled NiO/NiFe bilayers. In J. Fidler, B. Hillebrands, C. Ross, D. Weller, L. Folks, E. Hill, M. Vazquez Villalabeitia, J. A. Bain, J. De Boeck, & R. Wood (Eds.), INTERMAG Europe 2002 - IEEE International Magnetics Conference Article 1001190 (INTERMAG Europe 2002 - IEEE International Magnetics Conference). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/INTMAG.2002.1001190

Microscopic domain structure in unidirectional and isotropic exchange-coupled NiO/NiFe bilayers. / Hwang, D. G.; Kim, J. K.; Lee, S. S. et al.
INTERMAG Europe 2002 - IEEE International Magnetics Conference. ed. / J. Fidler; B. Hillebrands; C. Ross; D. Weller; L. Folks; E. Hill; M. Vazquez Villalabeitia; J. A. Bain; Jo De Boeck; R. Wood. Institute of Electrical and Electronics Engineers Inc., 2002. 1001190 (INTERMAG Europe 2002 - IEEE International Magnetics Conference).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Hwang, DG, Kim, JK, Lee, SS, Koo, H, Chung, SH, Dreyer, M & Gomez, RD 2002, Microscopic domain structure in unidirectional and isotropic exchange-coupled NiO/NiFe bilayers. in J Fidler, B Hillebrands, C Ross, D Weller, L Folks, E Hill, M Vazquez Villalabeitia, JA Bain, J De Boeck & R Wood (eds), INTERMAG Europe 2002 - IEEE International Magnetics Conference., 1001190, INTERMAG Europe 2002 - IEEE International Magnetics Conference, Institute of Electrical and Electronics Engineers Inc., 2002 IEEE International Magnetics Conference, INTERMAG Europe 2002, Amsterdam, Netherlands, 02/4/28. https://doi.org/10.1109/INTMAG.2002.1001190

Hwang DG, Kim JK, Lee SS, Koo H, Chung SH, Dreyer M et al. Microscopic domain structure in unidirectional and isotropic exchange-coupled NiO/NiFe bilayers. In Fidler J, Hillebrands B, Ross C, Weller D, Folks L, Hill E, Vazquez Villalabeitia M, Bain JA, De Boeck J, Wood R, editors, INTERMAG Europe 2002 - IEEE International Magnetics Conference. Institute of Electrical and Electronics Engineers Inc. 2002. 1001190. (INTERMAG Europe 2002 - IEEE International Magnetics Conference). doi: 10.1109/INTMAG.2002.1001190

Hwang, D. G. ; Kim, J. K. ; Lee, S. S. et al. / Microscopic domain structure in unidirectional and isotropic exchange-coupled NiO/NiFe bilayers. INTERMAG Europe 2002 - IEEE International Magnetics Conference. editor / J. Fidler ; B. Hillebrands ; C. Ross ; D. Weller ; L. Folks ; E. Hill ; M. Vazquez Villalabeitia ; J. A. Bain ; Jo De Boeck ; R. Wood. Institute of Electrical and Electronics Engineers Inc., 2002. (INTERMAG Europe 2002 - IEEE International Magnetics Conference).

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title = "Microscopic domain structure in unidirectional and isotropic exchange-coupled NiO/NiFe bilayers",

abstract = "The authors studied the thickness effect of NiO and NiFe on the microscopic domain structure and magnetization reversal in unidirectional and isotropic exchange-coupled NiO(0-60 nm)/NiFe(5-10 nm) films using magnetic force microscopy. As the NiO thickness increases, the microscopic domain structure of the unidirectional biased film changed from a mesh-type ripple pattern with no NiO to a more complicated and coarse-grained ripple structure at 60 nm. On the other hand, for the isotropic exchange coupled film, we observed a new cross-type domain with out-of plane magnetization.",

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AU - Hwang, D. G.

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AU - Chung, S. H.

AU - Dreyer, M.

AU - Gomez, R. D.

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N2 - The authors studied the thickness effect of NiO and NiFe on the microscopic domain structure and magnetization reversal in unidirectional and isotropic exchange-coupled NiO(0-60 nm)/NiFe(5-10 nm) films using magnetic force microscopy. As the NiO thickness increases, the microscopic domain structure of the unidirectional biased film changed from a mesh-type ripple pattern with no NiO to a more complicated and coarse-grained ripple structure at 60 nm. On the other hand, for the isotropic exchange coupled film, we observed a new cross-type domain with out-of plane magnetization.

AB - The authors studied the thickness effect of NiO and NiFe on the microscopic domain structure and magnetization reversal in unidirectional and isotropic exchange-coupled NiO(0-60 nm)/NiFe(5-10 nm) films using magnetic force microscopy. As the NiO thickness increases, the microscopic domain structure of the unidirectional biased film changed from a mesh-type ripple pattern with no NiO to a more complicated and coarse-grained ripple structure at 60 nm. On the other hand, for the isotropic exchange coupled film, we observed a new cross-type domain with out-of plane magnetization.

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BT - INTERMAG Europe 2002 - IEEE International Magnetics Conference

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A2 - Hillebrands, B.

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A2 - Weller, D.

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A2 - Bain, J. A.

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ER -

Microscopic domain structure in unidirectional and isotropic exchange-coupled NiO/NiFe bilayers

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