Microwave characterization of a field effect transistor with dielectrophoretically-aligned single silicon nanowire

Myung Gil Kang*, Jae Hyun Ahn, Jongwoon Lee, Dong Hoon Hwang, Hee Tae Kim, Jae Seong Rieh, Dongmok Whang, Maeng Ho Son, Doyeol Ahn, Yun Seop Yu, Sung Woo Hwang

*Corresponding author for this work

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    Material Science