Abstract
We have investigated the microwave properties of a set of Co-Fe-Al-O films with different thicknesses. The films show a well-defined in-plane anisotropy due to the bias field applied during deposition. The resonance frequency is determined through the scattering parameters measured with a vector network analyzer and a probing station connected to a coplanar waveguide. The results show that the resonance peak features depend on the direction of the applied/RF field and on the applied field history.
Original language | English |
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Pages (from-to) | 3508-3510 |
Number of pages | 3 |
Journal | IEEE Transactions on Magnetics |
Volume | 41 |
Issue number | 10 |
DOIs | |
Publication status | Published - 2005 Oct |
Keywords
- Anisotropy
- FeCo films
- Ferromagnetic resonance
- Magnetic thin films
- Microwave properties
- Nanogranular films
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Electrical and Electronic Engineering