Mitigating Heavy Ion Irradiation-Induced Degradation in p-type SnO Thin-Film Transistors at Room Temperature
- Nahid Sultan Al-Mamun
- , Md Abu Jafar Rasel
- , Douglas E. Wolfe
- , Aman Haque*
- , Ryan Schoell
- , Khalid Hattar
- , Seung Ho Ryu
- , Seong Keun Kim
*Corresponding author for this work
Research output: Contribution to journal › Article › peer-review
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