Engineering
Applicability
100%
Regularization
100%
Classification Task
100%
Semiconductor Manufacturing
100%
Neural Network Training
100%
Latest Trend
100%
Critical Failure
100%
Convolutional Neural Network
100%
Keyphrases
Wafer Bin Map
100%
Mixed-type Defects
100%
Training Model
42%
Defect Pattern
42%
Defect Type
28%
Single Defect
28%
Fabrication Methods
14%
Popular
14%
Performance Improvement
14%
On the Fly
14%
Map Data
14%
Classification Task
14%
Neural Network Training
14%
Semiconductor Manufacturing
14%
Multiple Defects
14%
Wafer Fabrication
14%
Yield Improvement
14%
Labeled Data
14%
Regularization Method
14%
Convolutional Neural Network
14%
Latest Trends
14%
Defect Prior
14%
Map Classification
14%
Network Regularization
14%
Systematic Defects
14%
Physics
Neural Network
100%
Convolutional Neural Network
50%