Modulated degradation of transient electronic devices through multilayer silk fibroin pockets

Mark A. Brenckle, Huanyu Cheng, Sukwon Hwang, Hu Tao, Mark Paquette, David L. Kaplan, John A. Rogers, Yonggang Huang, Fiorenzo G. Omenetto

Research output: Contribution to journal › Article › peer-review

70 Citations (Scopus)

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Material Science