Abstract
Atomistic details of an interfacial structure of Cu thin films on a Ni(0 0 1) substrate are investigated by molecular dynamics simulation using embedded atom method potentials. Results confirm the formation of stripes on the film surface with embedded {1 1 1} wedges, as reported by Müller et al., Phys Rev Lett 1996;76:2358, but suggest a different critical thickness (up to 11 Å) for appearance of the stripes.
Original language | English |
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Pages (from-to) | 1105-1109 |
Number of pages | 5 |
Journal | Scripta Materialia |
Volume | 52 |
Issue number | 11 |
DOIs | |
Publication status | Published - 2005 Jun |
Keywords
- Interfaces
- Molecular dynamics
- Strain relaxation
- Thin films
ASJC Scopus subject areas
- Materials Science(all)
- Condensed Matter Physics
- Mechanics of Materials
- Mechanical Engineering
- Metals and Alloys