The films of poly(p-phenylene vinylene) (PPV) were prepared by chemical vapor deposition (CVD) of α,α′-dichloro-p-xylene on the surface of crystalline silicon (001) wafer. Atomic force microscopy (AFM) and reflective IR were used for measuring the topographic images and the orientations of PPV chains, respectively. Photoluminescent (PL) property of the PPV films indicates that the details of PL spectrum are dependent on the thickness of the films deposited on the wafer surface. The UV-vis spectrum was also measured for the PPV films deposited on the amorphous quartz substrate.
|Number of pages||4|
|Journal||Molecular Crystals and Liquid Crystals Science and Technology Section A: Molecular Crystals and Liquid Crystals|
|Publication status||Published - 2002|
|Event||Proceedings of the Korea-Japan Joint Forum on Organic Materials for Electronics and Photonics (KJF2001) - Seoul, Korea, Republic of|
Duration: 2001 Sept 25 → 2001 Sept 27
Copyright 2008 Elsevier B.V., All rights reserved.
- Atomic force microscopy
- Chemical vapor deposition
- Reflective IR
- Silicon wafer
ASJC Scopus subject areas
- Condensed Matter Physics