Morphology and luminescence of poly (p-phenylene vinylene) films prepared by chemical vapor deposition

Guolun Zhong; Kyungkon Kim; Dongjune Ahn; Taeyoung Kim; Jung Il Jin

doi:10.1080/10587250290088816

Morphology and luminescence of poly (p-phenylene vinylene) films prepared by chemical vapor deposition

Guolun Zhong, Kyungkon Kim, Dongjune Ahn, Taeyoung Kim, Jung Il Jin

Department of Chemical and Biological Engineering

Research output: Contribution to journal › Conference article › peer-review

3 Citations (Scopus)

Abstract

The films of poly(p-phenylene vinylene) (PPV) were prepared by chemical vapor deposition (CVD) of α,α′-dichloro-p-xylene on the surface of crystalline silicon (001) wafer. Atomic force microscopy (AFM) and reflective IR were used for measuring the topographic images and the orientations of PPV chains, respectively. Photoluminescent (PL) property of the PPV films indicates that the details of PL spectrum are dependent on the thickness of the films deposited on the wafer surface. The UV-vis spectrum was also measured for the PPV films deposited on the amorphous quartz substrate.

Original language	English
Pages (from-to)	169-172
Number of pages	4
Journal	Molecular Crystals and Liquid Crystals Science and Technology Section A: Molecular Crystals and Liquid Crystals
Volume	377
DOIs	https://doi.org/10.1080/10587250290088816
Publication status	Published - 2002
Event	Proceedings of the Korea-Japan Joint Forum on Organic Materials for Electronics and Photonics (KJF2001) - Seoul, Korea, Republic of Duration: 2001 Sept 25 → 2001 Sept 27

Bibliographical note

Copyright:
Copyright 2008 Elsevier B.V., All rights reserved.

Keywords

Atomic force microscopy
Chemical vapor deposition
PPV
Photoluminescence
Reflective IR
Silicon wafer

ASJC Scopus subject areas

Condensed Matter Physics

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10.1080/10587250290088816

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Morphology and luminescence of poly (p-phenylene vinylene) films prepared by chemical vapor deposition. / Zhong, Guolun; Kim, Kyungkon; Ahn, Dongjune et al.
In: Molecular Crystals and Liquid Crystals Science and Technology Section A: Molecular Crystals and Liquid Crystals, Vol. 377, 2002, p. 169-172.

Research output: Contribution to journal › Conference article › peer-review

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abstract = "The films of poly(p-phenylene vinylene) (PPV) were prepared by chemical vapor deposition (CVD) of α,α′-dichloro-p-xylene on the surface of crystalline silicon (001) wafer. Atomic force microscopy (AFM) and reflective IR were used for measuring the topographic images and the orientations of PPV chains, respectively. Photoluminescent (PL) property of the PPV films indicates that the details of PL spectrum are dependent on the thickness of the films deposited on the wafer surface. The UV-vis spectrum was also measured for the PPV films deposited on the amorphous quartz substrate.",

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author = "Guolun Zhong and Kyungkon Kim and Dongjune Ahn and Taeyoung Kim and Jin, {Jung Il}",

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AU - Zhong, Guolun

AU - Kim, Kyungkon

AU - Ahn, Dongjune

AU - Kim, Taeyoung

AU - Jin, Jung Il

PY - 2002

Y1 - 2002

N2 - The films of poly(p-phenylene vinylene) (PPV) were prepared by chemical vapor deposition (CVD) of α,α′-dichloro-p-xylene on the surface of crystalline silicon (001) wafer. Atomic force microscopy (AFM) and reflective IR were used for measuring the topographic images and the orientations of PPV chains, respectively. Photoluminescent (PL) property of the PPV films indicates that the details of PL spectrum are dependent on the thickness of the films deposited on the wafer surface. The UV-vis spectrum was also measured for the PPV films deposited on the amorphous quartz substrate.

AB - The films of poly(p-phenylene vinylene) (PPV) were prepared by chemical vapor deposition (CVD) of α,α′-dichloro-p-xylene on the surface of crystalline silicon (001) wafer. Atomic force microscopy (AFM) and reflective IR were used for measuring the topographic images and the orientations of PPV chains, respectively. Photoluminescent (PL) property of the PPV films indicates that the details of PL spectrum are dependent on the thickness of the films deposited on the wafer surface. The UV-vis spectrum was also measured for the PPV films deposited on the amorphous quartz substrate.

KW - Atomic force microscopy

KW - Chemical vapor deposition

KW - PPV

KW - Photoluminescence

KW - Reflective IR

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JO - Molecular Crystals and Liquid Crystals Science and Technology Section A: Molecular Crystals and Liquid Crystals

JF - Molecular Crystals and Liquid Crystals Science and Technology Section A: Molecular Crystals and Liquid Crystals

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Y2 - 25 September 2001 through 27 September 2001

ER -

Morphology and luminescence of poly (p-phenylene vinylene) films prepared by chemical vapor deposition

Abstract

Bibliographical note

Keywords

ASJC Scopus subject areas

Access to Document

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