We studied the atomic and electronic structures of a one-dimensional (1-D) junction with low temperature scanning tunneling microscopy (STM). The junction smoothly connects two parts of single wall carbon nanotubes (CNTs) introducing defect structures. The two parts of the carbon nanotube are both semiconducting with the measured band gaps of 0.92 and 0.80 eV. In order to map out detailed electronic structures, we performed scanning tunneling spectroscopy (STS) measurement at the selected positions on the axis of carbon nanotubes. We observed gap states localized near the junction.
Bibliographical noteFunding Information:
We acknowledge financial support by the Ministry of Science and Technology of Korea (National Creative Research Initiatives and National R&D Project for Nano-Science and Technology), by Ministry of Commerce, Industry and Energy of Korea (Nano-Standard Project), and by the Korea University Grant.
- Carbon nanotubes
- Nano-scale structures
- One-dimensional junction
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Surfaces and Interfaces
- Surfaces, Coatings and Films
- Metals and Alloys
- Materials Chemistry