Non-contact measurement of current distribution in parallel conductors by using hall sensors

Myungjin Park, Sangbeom Byun, Wooseok Kim, Jikwang Lee, Kyeongdal Choi, Haigun Lee

    Research output: Contribution to journalArticlepeer-review

    11 Citations (Scopus)

    Abstract

    A parallel HTS conductor to flow large current is essential for applications of HTS power device. Non-uniform current distribution in the parallel conductor is caused mainly due to the difference of inductance. There are a contact method which measures current directly and a non-contact method which measure indirectly. But current distribution of each conductor in parallel conductors can not be measured with conventional method. In this paper, we researched a measurement method to identify current distribution of the parallel conductor indirectly with Hall sensors and compared with the analysis results by 2-D FEM.

    Original languageEnglish
    Article number4494477
    Pages (from-to)1135-1138
    Number of pages4
    JournalIEEE Transactions on Applied Superconductivity
    Volume18
    Issue number2
    DOIs
    Publication statusPublished - 2008 Jun

    Bibliographical note

    Funding Information:
    Manuscript received September 27, 2007. This work was supported by KESRI(R-2005-7-090), which is funded by MOCIE(Ministry of commerce, industry and energy). M. Park is with Korea Electrical Engineering & Science Research Institute (e-mail: [email protected]). S. Byun and K. Choi are with Korea Polytechnic University, Shiheung, Korea (e-mail: [email protected]). W. Kim is with Massachusetts Institute of Technology, Boston, USA (e-mail: [email protected]). J. Lee is with Woosuk University, Wanju, Chunbuk, Korea (e-mail: [email protected]). H. Lee is with Korea University, Seoul, Korea (e-mail: [email protected]. kr). Color versions of one or more of the figures in this paper are available online at http://ieeexplore.ieee.org. Digital Object Identifier 10.1109/TASC.2008.922512

    Keywords

    • Current distribution
    • HTS
    • Hall sensor

    ASJC Scopus subject areas

    • Electronic, Optical and Magnetic Materials
    • Condensed Matter Physics
    • Electrical and Electronic Engineering

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