A series of sputtered Fe(30 Å)/Si(x) superlattices were grown for x = 10-40 A ̊. Magnetization and Kerr hysteresis loops, and neutron-reflectivity measurements identify antiferromagnetic (AF) coupling of the Fe layers at room temperature for x = 15 A ̊ nominal thickness, with switching fields of 6 kOe. X-ray structural analyses indicate that the spacer medium is crystalline for x < 20 Å while sputtered Si is amorphous (a). Failure to detect oscillations in the AF coupling for thicker Si layers is due to the formation of a-Si, as opposed to the crystalline silicide responsible for the coupling.
Bibliographical noteFunding Information:
This work was supportedb y the US Department of Energy, BES-MaterialsS ciencesu, nder contract W-31-109-ENG-38.J .E.M. was supported by the NSF MRG contractN o. DMR-86-03304, S.R.L. was supportedb y the Ministry of Educationo f the Korean Governmenat,n dF.T.P. was supportedb y NSF contract No. DMR-87-07421.
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics