NTIRE 2019 challenge on real image denoising: Methods and results

Abdelrahman Abdelhamed, Radu Timofte, Michael S. Brown, Songhyun Yu, Bumjun Park, Jechang Jeong, Seung Won Jung, Dong Wook Kim, Jae Ryun Chung, Jiaming Liu, Yuzhi Wang, Chi Hao Wu, Qin Xu, Chuan Wang, Shaofan Cai, Yifan DIng, Haoqiang Fan, Jue Wang, Kai Zhang, Wangmeng ZuoMagauiya Zhussip, Dong Won Park, Shakarim Soltanayev, Se Young Chun, Zhiwei Xiong, Chang Chen, Muhammad Haris, Kazutoshi Akita, Tomoki Yoshida, Greg Shakhnarovich, Norimichi Ukita, Syed Waqas Zamir, Aditya Arora, Salman Khan, Fahad Shahbaz Khan, Ling Shao, Sung Jea Ko, Dong Pan Lim, Seung Wook Kim, Seo Won Ji, Sang Won Lee, Wenyi Tang, Yuchen Fan, Yuqian Zhou, DIng Liu, Thomas S. Huang, Deyu Meng, Lei Zhang, Hongwei Yong, Yiyun Zhao, Pengliang Tang, Yue Lu, Raimondo Schettini, Simone Bianco, Simone Zini, Chi Li, Yang Wang, Zhiguo Cao

Research output: Chapter in Book/Report/Conference proceedingConference contribution

82 Citations (Scopus)

Abstract

This paper reviews the NTIRE 2019 challenge on real image denoising with focus on the proposed methods and their results. The challenge has two tracks for quantitatively evaluating image denoising performance in (1) the Bayer-pattern raw-RGB and (2) the standard RGB (sRGB) color spaces. The tracks had 216 and 220 registered participants, respectively. A total of 15 teams, proposing 17 methods, competed in the final phase of the challenge. The proposed methods by the 15 teams represent the current state-of-the-art performance in image denoising targeting real noisy images.

Original languageEnglish
Title of host publicationProceedings - 2019 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops, CVPRW 2019
PublisherIEEE Computer Society
Pages2197-2210
Number of pages14
ISBN (Electronic)9781728125060
DOIs
Publication statusPublished - 2019 Jun
Externally publishedYes
Event32nd IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops, CVPRW 2019 - Long Beach, United States
Duration: 2019 Jun 162019 Jun 20

Publication series

NameIEEE Computer Society Conference on Computer Vision and Pattern Recognition Workshops
Volume2019-June
ISSN (Print)2160-7508
ISSN (Electronic)2160-7516

Conference

Conference32nd IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops, CVPRW 2019
Country/TerritoryUnited States
CityLong Beach
Period19/6/1619/6/20

Bibliographical note

Publisher Copyright:
© 2019 IEEE.

ASJC Scopus subject areas

  • Computer Vision and Pattern Recognition
  • Electrical and Electronic Engineering

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