Abstract
This paper reviews the NTIRE 2020 challenge on real world super-resolution. It focuses on the participating methods and final results. The challenge addresses the real world setting, where paired true high and low-resolution images are unavailable. For training, only one set of source input images is therefore provided along with a set of unpaired high-quality target images. In Track 1: Image Processing artifacts, the aim is to super-resolve images with synthetically generated image processing artifacts. This allows for quantitative benchmarking of the approaches w.r.t. a ground-truth image. In Track 2: Smartphone Images, real low-quality smart phone images have to be super-resolved. In both tracks, the ultimate goal is to achieve the best perceptual quality, evaluated using a human study. This is the second challenge on the subject, following AIM 2019, targeting to advance the state-of-the-art in super-resolution. To measure the performance we use the benchmark protocol from AIM 2019. In total 22 teams competed in the final testing phase, demonstrating new and innovative solutions to the problem.
Original language | English |
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Title of host publication | Proceedings - 2020 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops, CVPRW 2020 |
Publisher | IEEE Computer Society |
Pages | 2058-2076 |
Number of pages | 19 |
ISBN (Electronic) | 9781728193601 |
DOIs | |
Publication status | Published - 2020 Jun |
Event | 2020 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops, CVPRW 2020 - Virtual, Online, United States Duration: 2020 Jun 14 → 2020 Jun 19 |
Publication series
Name | IEEE Computer Society Conference on Computer Vision and Pattern Recognition Workshops |
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Volume | 2020-June |
ISSN (Print) | 2160-7508 |
ISSN (Electronic) | 2160-7516 |
Conference
Conference | 2020 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops, CVPRW 2020 |
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Country/Territory | United States |
City | Virtual, Online |
Period | 20/6/14 → 20/6/19 |
Bibliographical note
Publisher Copyright:© 2020 IEEE.
ASJC Scopus subject areas
- Computer Vision and Pattern Recognition
- Electrical and Electronic Engineering