Abstract
We report second-harmonic magneto-optic Kerr measurements on air-exposed, polycrystalline Ni81Fe19 thin films, ranging in thickness from 1 nm to 2 μm, on Al2O3 coated Si (001). For samples thicker than 20 nm, in the transverse Kerr geometry, we observe a factor of 4 change in second-harmonic intensity upon magnetization reversal. For thin samples, we observe interference between second-harmonic fields from the various interfaces and deterioration of ferromagnetism in the 1 and 2 nm films. Modeling suggests that the Ni81Fe19/Al2O3 interface has a larger second-order susceptibility than the air/Ni81Fe19 surface.
Original language | English |
---|---|
Pages (from-to) | 1573-1575 |
Number of pages | 3 |
Journal | Applied Physics Letters |
Volume | 68 |
Issue number | 11 |
DOIs | |
Publication status | Published - 1996 |
Externally published | Yes |
ASJC Scopus subject areas
- Physics and Astronomy (miscellaneous)