Observation of the transverse second-harmonic magneto-optic Kerr effect from Ni81Fe19 thin film structures

T. M. Crawford; C. T. Rogers; T. J. Silva; Y. K. Kim

doi:10.1063/1.115703

Observation of the transverse second-harmonic magneto-optic Kerr effect from Ni81Fe19 thin film structures

T. M. Crawford, C. T. Rogers, T. J. Silva, Y. K. Kim

Research output: Contribution to journal › Article › peer-review

23 Citations (Scopus)

Abstract

We report second-harmonic magneto-optic Kerr measurements on air-exposed, polycrystalline Ni81Fe19 thin films, ranging in thickness from 1 nm to 2 μm, on Al2O3 coated Si (001). For samples thicker than 20 nm, in the transverse Kerr geometry, we observe a factor of 4 change in second-harmonic intensity upon magnetization reversal. For thin samples, we observe interference between second-harmonic fields from the various interfaces and deterioration of ferromagnetism in the 1 and 2 nm films. Modeling suggests that the Ni81Fe19/Al2O3 interface has a larger second-order susceptibility than the air/Ni81Fe19 surface.

Original language	English
Pages (from-to)	1573-1575
Number of pages	3
Journal	Applied Physics Letters
Volume	68
Issue number	11
DOIs	https://doi.org/10.1063/1.115703
Publication status	Published - 1996
Externally published	Yes

ASJC Scopus subject areas

Physics and Astronomy (miscellaneous)

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title = "Observation of the transverse second-harmonic magneto-optic Kerr effect from Ni81Fe19 thin film structures",

abstract = "We report second-harmonic magneto-optic Kerr measurements on air-exposed, polycrystalline Ni81Fe19 thin films, ranging in thickness from 1 nm to 2 μm, on Al2O3 coated Si (001). For samples thicker than 20 nm, in the transverse Kerr geometry, we observe a factor of 4 change in second-harmonic intensity upon magnetization reversal. For thin samples, we observe interference between second-harmonic fields from the various interfaces and deterioration of ferromagnetism in the 1 and 2 nm films. Modeling suggests that the Ni81Fe19/Al2O3 interface has a larger second-order susceptibility than the air/Ni81Fe19 surface.",

author = "Crawford, {T. M.} and Rogers, {C. T.} and Silva, {T. J.} and Kim, {Y. K.}",

year = "1996",

doi = "10.1063/1.115703",

language = "English",

volume = "68",

pages = "1573--1575",

journal = "Applied Physics Letters",

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T1 - Observation of the transverse second-harmonic magneto-optic Kerr effect from Ni81Fe19 thin film structures

AU - Crawford, T. M.

AU - Rogers, C. T.

AU - Silva, T. J.

AU - Kim, Y. K.

PY - 1996

Y1 - 1996

N2 - We report second-harmonic magneto-optic Kerr measurements on air-exposed, polycrystalline Ni81Fe19 thin films, ranging in thickness from 1 nm to 2 μm, on Al2O3 coated Si (001). For samples thicker than 20 nm, in the transverse Kerr geometry, we observe a factor of 4 change in second-harmonic intensity upon magnetization reversal. For thin samples, we observe interference between second-harmonic fields from the various interfaces and deterioration of ferromagnetism in the 1 and 2 nm films. Modeling suggests that the Ni81Fe19/Al2O3 interface has a larger second-order susceptibility than the air/Ni81Fe19 surface.

AB - We report second-harmonic magneto-optic Kerr measurements on air-exposed, polycrystalline Ni81Fe19 thin films, ranging in thickness from 1 nm to 2 μm, on Al2O3 coated Si (001). For samples thicker than 20 nm, in the transverse Kerr geometry, we observe a factor of 4 change in second-harmonic intensity upon magnetization reversal. For thin samples, we observe interference between second-harmonic fields from the various interfaces and deterioration of ferromagnetism in the 1 and 2 nm films. Modeling suggests that the Ni81Fe19/Al2O3 interface has a larger second-order susceptibility than the air/Ni81Fe19 surface.

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DO - 10.1063/1.115703

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VL - 68

SP - 1573

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JO - Applied Physics Letters

JF - Applied Physics Letters

IS - 11

ER -

Observation of the transverse second-harmonic magneto-optic Kerr effect from Ni81Fe19 thin film structures

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