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On the scaling limits of low-frequency noise in SiGe HBTs
Jarle A. Johansen, Zhenrong Jin, John D. Cressler, Yan Cui, Guofu Niu, Qingqing Liang, Jae Sung Rieh, Greg Freeman, Dave Ahlgren, Alvin Joseph
Research output: Contribution to journal › Article › peer-review
4
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(Scopus)