Optical properties of SiO2/nanocrystalline Si multilayers studied using spectroscopic ellipsometry

  • Kang Ju Lee
  • , Tae Dong Kang
  • , Hosun Lee*
  • , Seung Hui Hong
  • , Suk Ho Choi
  • , Tae Yeon Seong
  • , Kyung Joong Kim
  • , Dae Won Moon
    • *Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

15 Citations (Scopus)

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Material Science