Optimizing multiplexing scheme in interferometric microscopy

Behnam Tayebi, Keyvan Jaferzadeh, Farnaz Sharif, Jae Ho Han

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)


In single exposure off-axis interferometry, multiple information can be recorded by spatial frequency multiplexing. We investigate optimum conditions for designing 2D sampling schemes to record larger field of view in off-axis interferometry multiplexing. The spatial resolution of the recorded image is related to the numerical aperture of the system and sensor pixel size. The spatial resolution should preserve by avoiding crosstalk in the frequency domain. Furthermore, the field of view depends on the sensor size and magnification of the imaging system. In order to preserve resolution and have a larger field of view, the frequency domain should be designed correctly. The experimental results demonstrate that selecting the wrong geometrical scheme in frequency domain decrease the recorded image area.

Original languageEnglish
Title of host publicationInterferometry XVIII
EditorsArmando Albertazzi Goncalves, Katherine Creath, Jan Burke
ISBN (Electronic)9781510603110
Publication statusPublished - 2016
EventInterferometry XVIII - San Diego, United States
Duration: 2016 Aug 302016 Sept 1

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X


OtherInterferometry XVIII
Country/TerritoryUnited States
CitySan Diego

Bibliographical note

Funding Information:
This work was supported in part by the Basic Science Research Program through the National Research Foundation of Korea (NRF-2013R1A1A2062448). B. Tayebi is supported by BK21 plus global leader development division in Brain Engineering.

Publisher Copyright:
© 2016 SPIE.


  • Holography.
  • Multiplexing
  • Quantitative phase microscopy

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering


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